Pattern Recognition and Deep Learning Technologies, Enablers of Industry 4.0, and Their Role in Engineering Research

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262.pdf (4.09 MB)

Date

2023

Document type

Artículo de revisión

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Investigación
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Authors

Serey, Joel, Alfaro, Miguel, Fuertes, Guillermo, Vargas, Manuel, Durán, Claudia A., Ternero, Rodrigo, Rivera, Ricardo, Sabattin, Jorge

Faculty

Facultad de Arquitectura, Animación, Diseño y Construcción

Publisher

MDPI

URI

http://repositorio.udla.cl/xmlui/handle/udla/1215, https://www.mdpi.com/journal/symmetry

DOI

10.3390/sym15020535

Keywords

Deep learning, Pattern recognition, Data management

Citation

Symmetry, 15(2), 29 p.

Extent

29 páginas
4.090Mb

Abstract

The purpose of this study is to summarize the pattern recognition (PR) and deep learning (DL) artificial intelligence methods developed for the management of data in the last six years. The methodolog...

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